Structural Characterization of SnOâ‚‚ Thick Film Doped with SiC

Authors

  • Nadira Kamarudin
  • Mohd Khairi Saidin

Abstract

A series of thick film samples with SnO₂ (active material), SiC (dopant) and ethyl cellulose and propylene glycol (organic binder) have been prepared using screen printing method. The thickness of samples prepared is between 1.10±0.01 µm to 2.36±0.01 µm. X-ray analysis has been done by using Philips PW Diffractometer. The diffraction peak from the X-ray analysis shows the sample have high degree of crystallinity. The lattice constant calculated for each sample shows that the samples produced has a tetragonal structure and the presence of SiC as dopant did not change the structure of SnO₂.

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Published

26-12-2002

How to Cite

Structural Characterization of SnOâ‚‚ Thick Film Doped with SiC. (2002). Malaysian Journal of Science (MJS), 21, 117-120. https://jpmm.um.edu.my/index.php/MJS/article/view/8870